Accelerating wheat genetic gain by establishing a high-throughput spike phenotyping platform

The architecture of cereal heads (or ears) is an important trait to understand cereal responses to heat and frost, as well as understanding water limited yield potential. International researchers have developed X-ray CT scanning methods to allow high throughput measurements of cereal head. This investment will allow the installation and testing of a X-ray CT scanner at the Australian Plant Phenomics Facility at the University of Adelaide. The system will be automated such that high throughput, non-destructive measures of thousands of lines will be able to be undertaken. This will represent a major innovation for improving the genetic stress tolerance of Australian crops. Protocols have already been developed to determine the level of damage on grain size and grain number of cereal ears impacted by frost, heat or drought. A series of pilot project will validate the system and develop new protocols that will help drive genetic gains for the Australian grains industry.